Individual skill
substrate-vulnerability-scanner
Scans Substrate/Polkadot pallets for 7 critical vulnerabilities including arithmetic overflow, panic DoS, incorrect weights, and bad origin checks. Use when auditing Substrate runtimes or FRAME pallets.
plugins/building-secure-contracts/skills/substrate-vulnerability-scanner/SKILL.md
Source commit e4dd0bb5b15535f7c5a0834187dffba6ac37e4ff
What was checked
- Matches the observed repository HEAD
- Yes
- Scanner rules are current
- Yes
- Repository scan complete
- No
- Skill scan complete
- No
- Observed behavior
- Network or broad shell
- Last checked
- Nov 9, 2026
These are observations at the recorded commit, not a guarantee of safety. Review the source before running it.
Install this skill
Choose an agent in your Stack or copy a command below. Commands fetch the pinned commit and copy only this skill directory. Existing destinations are refused. Copying a command does not install anything.
An install command is unavailable: current rules, complete repository and skill scans, an eligible behavior level and a permitted license are required.
Repository context
- Repository stars (not skill ratings)
- 8,083
- Repository last updated
- Nov 6, 2026
- License
- CC-BY-SA-4.0
Observed agent integration: No specific integration evidence. Standard SKILL.md installation does not imply verified compatibility.
- agent-skills Repository topic
- security Derived category
Files and excerpt
File metadata and permitted, redacted excerpts come from the recorded scan. Source links are pinned to that commit.
Browse files
SKILL.mdcore · 12,800 bytesSKILL.mdcore · 12,800 bytesSKILL.mdcore · 12,800 bytesSKILL.mdcore · 12,800 bytesSKILL.mdcore · 12,800 bytesSKILL.mdcore · 12,800 bytesSKILL.mdcore · 12,800 bytesSKILL.mdcore · 12,800 bytesSKILL.mdcore · 12,800 bytesSKILL.mdcore · 12,800 bytesSKILL.mdcore · 12,800 bytesagents/openai.yamlasset · 258 bytesassets/trail-of-bits-mark.svgasset · 3,084 bytesresources/VULNERABILITY_PATTERNS.mddoc · 24,903 bytes
No licensed excerpt is available. You can inspect the pinned source.