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fast-experiments

Use when designing or auditing a USENIX FAST storage evaluation, covering real devices and firmware, device-state control (aging, preconditioning, fill, TRIM), standard workloads and traces (SNIA IOTTA, YCSB, filebench, fio), write amplification, tail latency, endurance and wear, crash-consistency testing, fair baselines, and matching the metric to the shape of each storage claim.

FAST-Skills/skills/fast-experiments/SKILL.md

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# FAST Experiments

Use this before submission when the storage evaluation is not yet locked. FAST reviewers are storage
people; the evaluation is where a good idea is won or lost, and the questions are storage-specific.
The organizing principle is **measure the storage cost you claim to change, on real hardware in a
realistic state** — not a throughput bar on a fresh drive.

## Evaluation audit

- **Match the metric to the storage claim.** A claim about *endurance* needs bytes-written / P/E
  cycles, not throughput; a claim about *responsiveness* needs **tail latency** (p99/p99.9), not the
  mean; a claim about *space* needs measured on-media footprint; a claim about *durability* needs a
  crash-consistency test. The wrong metric is the most common FAST reject.
- **Use real devices, and name them.** Model, capacity, interface (SATA/SAS/NVMe), and — critically
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