Individual skill
afm-spm-analyzer
Atomic Force Microscopy and Scanning Probe Microscopy skill for nanoscale topography, mechanical, and electrical property mapping
library/specializations/domains/science/nanotechnology/skills/afm-spm-analyzer/SKILL.md
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- Last checked
- Nov 9, 2026
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- License
- MIT
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SKILL.mdcore · 2,375 bytes
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# AFM-SPM Analyzer
## Purpose
The AFM-SPM Analyzer skill provides comprehensive atomic force and scanning probe microscopy data analysis for nanoscale surface characterization, including topography, mechanical properties, and electrical measurements.
## Capabilities
- Topography imaging and analysis
- Surface roughness calculation (Ra, RMS)
- Force-distance curve analysis
- Nanoindentation and mechanical mapping
- Kelvin probe force microscopy (KPFM)
- Conductive AFM measurements