Individual skill

ieee-transactions

Format and submit papers to IEEE journals (Transactions, Journals, Letters, IEEE Access) and IEEE conferences using the IEEEtran LaTeX class or Word templates, covering journal vs conference modes, abstracts and index terms, numbered IEEE reference style, figures and equations, author biographies, page limits and overlength charges, IEEE PDF eXpress, copyright forms, double-blind options and ScholarOne/IEEE Author Portal submission. Use when writing for any IEEE venue, fixing IEEEtran layout issues, or checking IEEE submission compliance.

plugins/KalarisLabs/research-agent-skills/skills/ieee-transactions/SKILL.md

Read pinned source

Source commit d780783eba4ecc7c8b9429f95c9362df95f07c61

What was checked

Matches the observed repository HEAD
Yes
Scanner rules are current
Yes
Repository scan complete
No
Skill scan complete
No
Observed behavior
Network or broad shell
Last checked
Nov 4, 2026

These are observations at the recorded commit, not a guarantee of safety. Review the source before running it.

Install this skill

Choose an agent in your Stack or copy a command below. Commands fetch the pinned commit and copy only this skill directory. Existing destinations are refused. Copying a command does not install anything.

An install command is unavailable: current rules, complete repository and skill scans, an eligible behavior level and a permitted license are required.

Repository context

Repository stars (not skill ratings)
1,533
Repository last updated
Nov 6, 2026
License
Apache-2.0

Observed agent integration: No specific integration evidence. Standard SKILL.md installation does not imply verified compatibility.

Declared tags are partial or unavailable.

Files and excerpt

File metadata and permitted, redacted excerpts come from the recorded scan. Source links are pinned to that commit.

Browse files
Read excerpt

# IEEE Journals and Conferences

## Verify first (mandatory)

Each IEEE periodical and conference sets its own page limits, overlength charges, review
model (single- vs double-blind) and submission system. Check:
- The journal's "Information for Authors" page (from its IEEE Xplore home) or the conference call for papers.
- IEEE Author Center: https://journals.ieeeauthorcenter.ieee.org/ (journals) and the conference author kit.
- The official template via the IEEE Template Selector (https://template-selector.ieee.org/).

Record: page limit (initial vs final), reference counting, overlength charges, anonymization
rules, and whether a graphical abstract or multimedia is allowed.

## LaTeX setup (IEEEtran)